Cecilia A., Jary V., Nikl M., Mihokova E., Hanschke D., Hamann E., Douissard P.-A., Rack A., Martin T., Krause B., Grigorievc D., Baumbach T., Fiederle M.

in Radiation Measurements, 62 (2014) 28-34. DOI:10.1016/j.radmeas.2013.12.005

Abstract

In this work, a group of Lu2SiO5:Tb (LSO:Tb) scintillating layers with a Tb concentration between 8% and 19% were investigated by means of synchrotron and laboratory techniques. The scintillation efficiency measurements proved that the highest light yield is obtained for a Tb concentration equal to 15%. At higher concentration, quenching processes occur which lower the light emission. The analysis of the reciprocal space maps of the (082) (280) and (040) Bragg reflections showed that LSO:Tb epilayers are well adapted on YbSO substrates for all the investigated concentrations. The spatial resolution tests demonstrated the possibility to achieve a resolution of 1 μm with a 6 μm thick scintillating layer. © 2014 Elsevier Inc. All rights reserved.

4 citations of “Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications